Test house

Microtest provides complete test house services in a clear room equipped with the state of the art handler and wafer probing system using its own innovative ATE.

The test house operates in hot, cold and room temperature for both production and characterization test.

Innovative reliability system for Burn In and HTOL Services

Statistical analysis is performed for digital and mixed-signal devices.

Microtest Pacific Test house is located in Malacca (Malaysia).

Activity Supported

TURN KEY TEST SOLUTION DEVELOPMENT

Highly qualified testing engineers support the customers all over the world for turn key test solution development.

State of the art tester platform availability.

  • 30 years of experience in microelectronic engineering
  • Knowledge in full applications, automotive, industrial, healthcare, space, consumer, RF
  • State of art of used equipment (ATE, OLT, Burn-in, prober, etc.).
  • Design for testability to help to reduce cost of test and improve quality
  • Turn-key solution from DFT to mass production
  • Continuous improvement during production phase:
    • Test Time optimization
    • Yield improvement
    • S-PAT, D-PAT, G-PAT, Z-PAT implementation

Equipment available:

Microtest DMT

Electrical Wafer Sorting (EWS), using the DMT on a prober through a Pogo Ring, to find faulty devices during the early stages of the production, saving time and cost.

Microtest VIP Extender

The VIP Extended is used in Electrical Wafer Sorting (EWS) or mounted over the strip handler using a lightweight manipulator. VIP Extended in Final testing, using gravity handler or pick and place, ensures that every piece sold is totally compliant with the specifications and no faulty device will be sold.

OVENLESS BURN-IN & HTOL SOLUTION

The first ovenless burn-in on the market!

Microtest Burn-in is an innovative and fully automatic solution that drastically reduce industrial costs and increase quality of test

Main feature:

  • Heater embedded for each DUT
  • Up to 24 Burn-in Boards per system
  • Up to 120 devices per board
  • Automatic loader compatibility
  • Small footprint
  • DUT heater independent control DUT
  • Very low power consumption
  • High reliability and accuracy
  • Only the device at high temperature

VOLUME PRODUCTION

Microtest high skilled team of engineers is able to follow the product development from EWS to final test.

  • Production engineers available for monitoring and guarantee the quality of production test.
  • Quality of the test continuously checked and improved
    • Test Time and Test Program optimization
    • Yield improvement
    • S-PAT, D-PAT, G-PAT, Z-PAT implementation
  • Automatic yield loss stop control
  • Automatic data analysis integrity and post processing available. Data available for the download in a secure area.
  • Engineering reporting for yield loss analysis
  • Possibility to test in Europe and in Far-East
  • EWS, FT, hot cold and room from -70° to 180°
  • Low and high volume Burn-in service
  • AEC Q